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Multi-layered graphene sample

Raman image of multi-layered graphene sample

Graphene monolayer, bilayer and other multiple-layer regions identified

StreamLine™ Plus image showing the distribution of different thicknesses within a graphene flake

Map area: 110 µm x 120 µm

Spectra generated: 40,000

Acquisition time: 14 minutes

CVD diamond film

Polished CVD diamond film

Polished surface of polycrystalline diamond film grown by CVD technique

Images show information on crystal shape, orientation, stresses and defect densities

Map area: 175 µm x 88 µm

Spectra generated: 51,200

Acquisition time: 2 imaging experiments, 15 minutes each (first acquisition used to generate three Raman images, second acquisition used to generate photoluminescence image)

Image 1: Raman image showing 1 cm-1 variation in position of the 1332 cm-1 diamond band

Image 2: Raman image showing 2 cm-1 variation in width of the 1332 cm-1 diamond band

Image 3: Raman image showing variation in peak area of the 1332 cm-1 diamond band

Image 4: Photoluminescence image showing variation in the intensity of the 1.68 eV neutral silicon vacancy [Si-V]0 band

Micro indentation in silicon wafer

Silicon indent - peak position map

Peak position

Peak position derived from curve-fit analysis

Map area: 10 µm x 10 µm

Spectra generated: 10,000

Acquisition time: 36 minutes (single acquisition analysed for both images)

Scan details: 100 nm step achieved using piezoelectic scanning stage

Silicon indent - peak area map

Peak width

Peak width derived from curve-fit analysis

Sandstone from Loch Torridon, Scotland

Sandstone from Loch Torridon

StreamLine™ Plus image showing the distribution of Anatase (TiO2) (red), Quartz (SiO2) (green) and Haematite (Fe2O3) (blue)

Area of section: 500 µm x 320 µm

Spectra generated: 67,200

Acquisition time: 20 minutes

Polymer laminate (PS and PMMA)

Polymer laminate (PS and PMMA)

StreamLine™ Plus image of polymer laminate sample showing the distribution of PMMA (red), Epoxy (green) and PS (blue)

Map area: 240 µm x 645 µm

Spectra generated: 17,200

Acquisition time: 7 minutes

Strained S-Ge cross-hatch

Si-Ge_crosshatch

StreamLine™ Plus image of a Si-Ge semiconductor sample exhibiting a strained structure. The map shows variation in the Si-Si 510 cm-1 band position (~0.2 cm-1 positional band shift). The map data was generated using curve fitting.

Map area: 129µm x 130µm

Spectra generated: 55,000

Acquisition time: 13 minutes

Tooth section

Raman image of tooth

StreamLine™ Plus image of a sectioned tooth, highlighting the enamel (green), dentine (blue) and areas of high fluorescence (red)

Map area: 9mm x 16mm

Spectra generated: 84,000

Acquisition time: 20 minutes

Multilayred graphene sample

Laser induced crystalline silicon tracks

Laser induced crystalline silicon tracks on amorphous substrate

StreamLine™ Plus image of laser induced crystalline silicon tracks on amorphous substrate

Map area: 550µm x 550µm

Spectra generated: 70,000

Acquisition time: 17 minutes

Zoom of silicon tracks Zoomed region (~ 250µm x 250µm) of above image
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